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dc.contributor.authorKuru, Hilal
dc.contributor.authorKöçkar, Hakan
dc.contributor.authorAlper, Mürsel
dc.date.accessioned2019-07-29T06:10:55Z
dc.date.available2019-07-29T06:10:55Z
dc.date.issued2015en_US
dc.identifier.issn1573-482X
dc.identifier.issn0957-4522
dc.identifier.urihttps://doi.org/10.1007/s10854-015-3014-3
dc.identifier.urihttps://hdl.handle.net/20.500.12462/5693
dc.descriptionKuru, Hilal (Balikesir Author)en_US
dc.description.abstractElectrochemically deposited permalloy based NiFe/Cu multilayers, relating their magnetic and magnetoresistance properties with crystal structure and the corresponding film composition were studied as a function of the total film thickness. The permalloy based multilayers were grown on strong (110) textured copper sheets with electrodeposition under potentiostatic control. The total multilayer film thickness was changed from 0.3 to 5 mu m while ferromagnetic nickel-iron and nonmagnetic copper layer thickness was kept constant at 3 and 1 nm, respectively. Energy dispersive X-ray analysis revealed that the nickel and iron content of the multilayers decreased and copper content increased as the total film thickness increased. All multilayers exhibited face-centred cubic structure with (110) preferred orientation. The highest peak intensity changed from (220) to (111) when the total thickness was higher than 2 mu m. The multilayers exhibited giant magnetoresistance (GMR). The maximum GMR magnitude of similar to 4 % was obtained for the films with total thickness less than 1 mu m and the GMR decreased down to similar to 1 % with increasing film thickness to 5 mu m. The saturation magnetisation and coercivity decreased from 78 to 11 emu/cm 3 and from 24 to 12 Oe as the total thickness of the multilayers increased from 0.3 to 5 mu m, respectively. The variations in magnetic and magnetoresistive properties related to the microstructure were attributed to the variation of the film contents caused by total film thickness.en_US
dc.description.sponsorshipBalikesir University Research Grant BAP 2001/02 2005/38 State Planning Organization (DPT) 2005K120170en_US
dc.language.isoengen_US
dc.publisherSpringeren_US
dc.relation.isversionof10.1007/s10854-015-3014-3en_US
dc.rightsinfo:eu-repo/semantics/embargoedAccessen_US
dc.titleA study on total thickness dependency: microstructural, magnetoresistance and magnetic properties of electrochemically deposited permalloy based multilayersen_US
dc.typearticleen_US
dc.relation.journalJournal of Materials Science-Materials in Electronicsen_US
dc.contributor.departmentFen Edebiyat Fakültesien_US
dc.contributor.authorID0000-0002-4862-0490en_US
dc.identifier.volume26en_US
dc.identifier.issue7en_US
dc.identifier.startpage5009en_US
dc.identifier.endpage5013en_US
dc.relation.tubitakinfo:eu-repo/grantAgreement/TUBITAK/TBAG-1771en_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US


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