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dc.contributor.authorTekgül, Atakan
dc.contributor.authorAlper, Mürsel
dc.contributor.authorKöçkar, Hakan
dc.date.accessioned2019-10-01T11:30:24Z
dc.date.available2019-10-01T11:30:24Z
dc.date.issued2017en_US
dc.identifier.issn0304-8853
dc.identifier.issn1873-4766
dc.identifier.urihttps://doi.org/10.1016/j.jmmm.2016.06.039
dc.identifier.urihttps://hdl.handle.net/20.500.12462/6535
dc.descriptionKöçkar, Hakan (Balikesir Author)en_US
dc.description.abstractThe CoFe/Cu magnetic multilayers were produced by changing CoFe ferromagnetic layers from 3 nm to 10 nm using electrodeposition. By now, the thinnest Cu (0.5 nm) layer thicknesses were used to see whether the GMR effect in the multilayers can be obtained or not since the pinning of non-magnetic layer between the ferromagnetic layers is required. For the proper depositions, the cyclic voltammograms was used, and the current-time transients were obtained. The Cu and CoFe layers were deposited at a cathode potential of -0.3 and -1.5 V with respect to saturated calomel electrode, respectively. From the XRD patterns, the multilayers were shown to be fcc crystal structures. For the magnetization measurements, saturation magnetization increases from 160 to 600 kA/m from 3 to 8 nm ferromagnetic layer thicknesses. And, the coercivity values increase until the 8 nm of the CoFe layer thickness. It is seen that the thin Cu layer(fixed at 0.5 nm) and pinholes support the random magnetization orientation and thus all multilayers exhibited the giant magnetoresistance(GMR) effect, and the highest GMR value was observed about 5.5%. And, the variation of GMR field sensitivity was calculated. The results show that the GMR and GMR sensitivity are compatible among the multilayers. The CoFe/Cu magnetic multilayers having GMR properties are used in GMR sensors and hard disk drive of the nano-technological devices.en_US
dc.description.sponsorshipUludag University - UAP(F)-2010/56 Balikesir University - BAP2001/02en_US
dc.language.isoengen_US
dc.publisherElsevier Science Bven_US
dc.relation.isversionof10.1016/j.jmmm.2016.06.039en_US
dc.rightsinfo:eu-repo/semantics/embargoedAccessen_US
dc.subjectElectrodepositionen_US
dc.subjectGMRen_US
dc.subjectMultilayeren_US
dc.subjectXRDen_US
dc.subjectCofe/Cu Multilayeren_US
dc.titleSimple electrodepositing of CoFe/Cu multilayers: Effect of ferromagnetic layer thicknessesen_US
dc.typearticleen_US
dc.relation.journalJournal of Magnetisma and Magnetic Materialsen_US
dc.contributor.departmentFen Edebiyat Fakültesien_US
dc.contributor.authorID0000-0002-4862-0490en_US
dc.contributor.authorID0000-0001-6737-3838en_US
dc.identifier.volume421en_US
dc.identifier.startpage472en_US
dc.identifier.endpage476en_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US


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