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dc.contributor.authorMonavarian, Morteza
dc.contributor.authorMetzner, Sebastian
dc.contributor.authorIzyumskaya, Natalia
dc.contributor.authorOkur, Serdal
dc.contributor.authorZhang, Fan
dc.contributor.authorCan, Nuri
dc.contributor.authorDas, Saikat
dc.contributor.authorAvrutin, Vitaliy
dc.date.accessioned2019-11-18T06:45:07Z
dc.date.available2019-11-18T06:45:07Z
dc.date.issued2015en_US
dc.identifier.issn0277-786X
dc.identifier.issn1996-756X
dc.identifier.urihttps://doi.org/10.1117/12.2079180
dc.identifier.urihttps://hdl.handle.net/20.500.12462/9807
dc.descriptionCan, Nuri (Balikesir Author)en_US
dc.description.abstractEnhancement of optical and structural quality of semipolar (11 (2) over bar2) GaN grown by metal-organic chemical vapor deposition on planar m-sapphire substrates was achieved by using an in situ epitaxial lateral overgrowth technique with nanoporous SiNx layers employed as masks. The effect of SiNx deposition time on optical and structural quality of the films was studied by steady-state photoluminescence (PL) and X-ray diffraction. The intensity of room temperature PL for the (11 (2) over bar2) samples grown with nanoporous SiNx was found to be up to four times higher compared to those for the reference samples having the same thickness but no SiNx interlayers. This finding is attributed to the blockage of dislocation propagation toward the surface by the SiNx interlayers. Low-temperature PL measurements also revealed the improvement of structural quality gained by the employment of the SiNx interlayers which manifests itself as the increase in intensity of donor bound exciton emission. In agreement with the optical data, full width at half maximum values of (11 (2) over bar2) X-ray rocking curves measured for two different in-plane rotational orientations of [1 (1) over bar 00] and [11 (2) over bar3] reduced from 0.33 degrees and 0.26 degrees for the reference samples to 0.2 degrees and 0.16 degrees for the nano-ELO structures grown under optimized conditions, respectively.en_US
dc.language.isoengen_US
dc.publisherSpie-Int Soc Optical Engineeringen_US
dc.relation.isversionof10.1117/12.2079180en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectGanen_US
dc.subjectSemipolaren_US
dc.subjectELOen_US
dc.subjectSINx Nano-Meshen_US
dc.subjectPhotoluminescenceen_US
dc.subjectX-Ray Diffractionen_US
dc.subjectMOCVDen_US
dc.subjectQuantum Confined Stark Effecten_US
dc.titleEnhancement of optical and structural quality of semipolar (11(2)over-bar2) gan by introducing nanoporous sinx interlayersen_US
dc.typeconferenceObjecten_US
dc.relation.journalGallium Nitride Materials and Devices Xen_US
dc.contributor.departmentFen Edebiyat Fakültesien_US
dc.identifier.issue9363en_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US


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