dc.contributor.author | Tekgül, Atakan | |
dc.contributor.author | Alper, Mürsel | |
dc.contributor.author | Köçkar, Hakan | |
dc.contributor.author | Haciismailoğlu, Mürşide | |
dc.date.accessioned | 2019-10-17T10:40:12Z | |
dc.date.available | 2019-10-17T10:40:12Z | |
dc.date.issued | 2015 | en_US |
dc.identifier.issn | 0957-4522 | |
dc.identifier.issn | 1573-482X | |
dc.identifier.uri | https://doi.org/10.1007/s10854-015-2699-7 | |
dc.identifier.uri | https://hdl.handle.net/20.500.12462/8219 | |
dc.description | Köçkar, Hakan (Balikesir Author) | en_US |
dc.description.abstract | A series of CoFe/Cu multilayer was electrodeposited as a function of ferromagnetic and non- ferromagnetic layer thicknesses on Ti substrates from a single electrolyte containing Co (from CoSO4), Fe (from FeSO4), Cu (from CuSO4) metal ions under potentiostatic control. The deposition was carried out in a three electrode cell at room temperature. The Cu and CoFe layers were deposited at a cathode potential of -0.3 and -1.5 V with respect to saturated calomel electrode respectively. The structural studies by X-ray diffraction revealed that the multilayers have face-centered-cubic structure. The magnetic characteristics of the films were investigated using a vibrating sample magnetometer and their easy-axis was found to be in the film plane. Magnetoresistance measurements were carried out at room temperature with magnetic fields up to +/- 955 kA/m using the Van der Pauw method. All multilayers exhibited giant magnetoresistance (GMR). The GMR values up to 22 % and a GMR sensitivity of 52 % per 1 kA/m were obtained. | en_US |
dc.description.sponsorship | State Planning Organization, Turkey - 2005K120170
Balikesir University - 2001/02 | en_US |
dc.language.iso | eng | en_US |
dc.publisher | Springer | en_US |
dc.relation.isversionof | 10.1007/s10854-015-2699-7 | en_US |
dc.rights | info:eu-repo/semantics/embargoedAccess | en_US |
dc.title | The effect of ferromagnetic and non-ferromagnetic layer thicknesses on the electrodeposited cofe/cu multilayers | en_US |
dc.type | article | en_US |
dc.relation.journal | Journal of Materials Science-Materials in Electronics | en_US |
dc.contributor.department | Fen Edebiyat Fakültesi | en_US |
dc.contributor.authorID | 0000-0002-4862-0490 | en_US |
dc.contributor.authorID | 0000-0001-6737-3838 | en_US |
dc.contributor.authorID | 0000-0001-5648-3230 | en_US |
dc.identifier.volume | 26 | en_US |
dc.identifier.issue | 4 | en_US |
dc.identifier.startpage | 2411 | en_US |
dc.identifier.endpage | 2417 | en_US |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |